/Products/Systems and data acquisition/Crash test measurement system/Crash test data acquisition systems (DAQ/DAS)/Data acquisition modules nxt32 for crash testing, for use with in-dummy or onboard systems

Data acquisition modules nxt32 for crash testing, for use with in-dummy or onboard systems / K3870B

These data acquisition modules for simultaneous data recording in crash testing applications come with 32 analog and 16 digital channels and a maximum sampling rate of 100 kHz.

K3870B

These data acquisition modules for simultaneous data recording in crash testing applications come with 32 analog and 16 digital channels and a maximum sampling rate of 100 kHz.
 
  • Applicable for in-dummy and on-board systems
  • 32 analog and 16 digital channels
  • Li-ion battery integrated
  • Shunt check and programmable offset compensation
  • Daisy chaining of several units without a hub
  • Exceeds SAE J211 and ISO 6487
  • Direct recording in flash memory