Even the smallest mechanical stress or vibration can disrupt semiconductor production and reduce yield. 

This webinar explores how real-time force and vibration measurement using piezoelectric technology from Kistler helps detect anomalies early, optimize processes, and improve equipment uptime.

You’ll gain insights into: 

• Fundamentals of piezoelectric sensing for dynamic force and vibration monitoring
• Sensor integration into semiconductor equipment
• Real-time data acquisition and analysis for process control and anomaly detection
• Industrial use cases demonstrating inline monitoring, predictive maintenance, and closed-loop control

Join us to explore how dynamic measurement technology supports smarter production, consistent quality, and higher yield – and how Kistler helps you unlock the full potential of your processes.