Home/Products/Systems and data acquisition/Crash test measurement system/Crash test dummies/DTI integration solutions for all major frontal, side and rear-impact crash test dummies (ATDs)/SID-IIs

In-dummy data acquisition (DAS) integration for SID-IIs crash test dummy / SID-IIs

In-dummy data acquisition (DAS) integration for SID-IIs crash test dummy
SID-IIs
20000245
  • In-dummy instrumentation: standard or advanced
  • DTI375.08 and UPS DTI375.01
  • Max. number of channels: 96
  • DTI integration to comply with Part 572 Subpart V, 2008
Upon request
On request
Log in to myKistler to see prices
Product type
Crash test dummy type
Side Impact ATDs
The SID-IIs ATD can be equipped with a dedicated Kistler DTI integration solution that replaces conventional analog or other instrumentation with a compact digital measurement architecture. The integration minimizes wiring inside the dummy, simplifies installation, and provides a reliable platform for synchronized data acquisition while preserving the original mass properties and mechanical behavior of the ATD. The solution supports both standard and customized instrumentation configurations for research and development applications.
Loading
Loading